M-shell ionization cross sections for 75-300 KEV protons on TM using thick and thin targets

摘要

Low energy protons were used to excite M x-rays from elemental targets of Thulium. The x-rays were measured with a high-resolution Si(Li) detector equipped with an ultra-thin window. Separate measurements were taken with a hhick target and a thin target. The accuracy and precision of the results using each target will be contrasted and x-ry production cross sections will be compared with the ECPSSR theory (1).