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MR glide inspection for hard disk defect detection

机译:MR滑动检查用于硬盘缺陷检测

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Abstract: In a disk drive magnetic read/write is achieved with a magnetic head flying closely over a magnetic disk. As area 1 recording density is increased to several Gbits/In$+2$/, the dynamic flying height of the magnetic head is reduced to one $mu@-inch or less. Bumps taller than one $mu@-inch often results in head crash. Since the DLC coating on the magnetic disk surface is less than 10 nanometers in thickness, pits with depth over 10 nanometers cause damage to the magnetic layer. To prevent head crash or missing bit errors, magnetic disk surface needs to be examined for bumps taller than the dynamic flying height and pits deeper than the DLC thickness. In this paper, we report experimental results using a head with an MR sensor flying over a disk with precision bumps and pits micro-fabricated on the disk surface. Non-contact signal disturbances of the MR sensor flown over variable area square pits and bumps on the 2400 Oe media exhibit both magnetic and thermal signal characteristics. The lateral sizes of the pits and bumps obtained using the MR magnetic signal measured from a Phase Metrics MG250 tester agree well with those measured with an Atomic Force Microscope (AFM). The thermal signal characteristics of the pits and bumps are of opposite polarity, and scale in a non-linear fashion with the lateral size of the surface defects. Some preliminary experimental results involving naturally occurring surface defects and Phase Metrics' optical scatterometry tester PS5100 are also discussed for comparison purposes. !7
机译:摘要:在磁盘驱动器中,磁头在磁盘上紧密飞行,实现了磁读/写。当区域1的记录密度增加到几Gbits / In $ + 2 $ /时,磁头的动态飞行高度减小到一个$ mu @ -inch或更小。高于1美元/英寸的颠簸通常会导致头部撞车。由于磁盘表面上的DLC涂层的厚度小于10纳米,因此深度超过10纳米的凹坑会损坏磁层。为了防止磁头碰撞或丢失位错误,需要检查磁盘表面的凸点是否高于动态飞行高度,以及凹点是否比DLC厚度深。在本文中,我们报告了使用带有MR传感器的磁头飞过磁盘的实验结果,该磁盘在磁盘表面上微加工了精密的凹凸。在2400 Oe介质上的可变面积正方形凹坑和凸块上流动的MR传感器的非接触信号扰动同时具有磁信号特性和热信号特性。使用从Phase Metrics MG250测试仪测得的MR磁信号获得的凹坑和凸块的横向尺寸与用原子力显微镜(AFM)测得的尺寸十分吻合。凹坑和凸块的热信号特性具有相反的极性,并且随着表面缺陷的横向尺寸以非线性方式缩放。为了进行比较,还讨论了一些涉及自然发生的表面缺陷的初步实验结果和Phase Metrics的光学散射测试仪PS5100。 !7

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