...
首页> 外文期刊>The International Journal of Advanced Manufacturing Technology >Effects of flying height deviations on glide height tests for manufacturing hard disks
【24h】

Effects of flying height deviations on glide height tests for manufacturing hard disks

机译:飞行高度偏差对制造硬盘滑行高度测试的影响

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

In this study, theoretical analysis and experiments were carried out to investigate the effects of avalanche-point deviation and the deviation between the calibration and test-flying heights during the glide head calibration in the glide height tests for manufacturing hard disks. To obtain accurate glide height test results and improve the reproducibility of the test, flying height control should be carried out by limiting the acceptable deviation range of the flying heights of the glide heads. When the avalanche-point deviation is zero, the test results using different calibrated rails (or heads) are the same when they are used to detect the same defect. To avoid wrong test results due to avalanche-point deviation, the test-flying height should be the same as the calibration flying height because the difference of the output voltages of any two rails (or heads) is zero in this case. If these two deviations cannot be eliminated completely, the calibration and test-flying heights should be carefully selected because the error still can be minimised depending on the selection of the flying heights.
机译:在这项研究中,进行了理论分析和实验,以研究制造硬盘的滑行高度测试中,在滑行头校准过程中雪崩点偏差以及校准高度与试飞高度之间的偏差的影响。为了获得准确的滑行高度测试结果并提高测试的可重复性,应通过限制滑行头飞行高度的可接受偏差范围来执行飞行高度控制。当雪崩点偏差为零时,使用不同的校准轨(或磁头)的测试结果在用于检测相同缺陷时是相同的。为避免雪崩点偏差引起的错误测试结果,测试飞行高度应与校准飞行高度相同,因为在这种情况下,任何两个导轨(或磁头)的输出电压之差为零。如果不能完全消除这两个偏差,则应谨慎选择校准高度和试飞高度,因为根据飞高的选择,仍可以将误差降至最低。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号