Panel discussion for 'Have we overcome the Challenges associated with SoC and Multi-Core testing?'

摘要

With a growing number of System-on-Chip (SoC) and Multi-Core products entering the marketplace, innovative solutions have been created to overcome the challenges these products bring in terms of testability. Some of the challenges associated with SoC and Multi-Core testing are related to scan test, memory test, asynchronous interface, debug, and tester related challenges. This paper describes the particular ways the CELL processor has overcome these challenges.