首页> 外文会议>IMAPS International Conference on High Temperature Electronics Network >Increased High-Temperature Reliability and Package Hardening of Commercial Integrated Circuits (Through Die Extraction, Electroless Nickel/Gold Pad Reconditioning, and Ceramic Reassembly) - (PPT)
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Increased High-Temperature Reliability and Package Hardening of Commercial Integrated Circuits (Through Die Extraction, Electroless Nickel/Gold Pad Reconditioning, and Ceramic Reassembly) - (PPT)

机译:增加高温可靠性和商业集成电路的包装硬化(通过模具提取,无电镍/金垫修复和陶瓷重新组装) - (PPT)

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摘要

GCI's Extraction Capability is Proven and Reliable, Standard High-Temperature Packaging Increases Life Times by More Than 250x (for Applications > 185C), Ni/Au or Ni/Pd/Au Pad Reconditioning Increases Life Times by More than 1000x (for Applications > 185C), Ni/Au or Ni/Pd/Au Pad Reconditioning Allows for Conventional Assembly While Maintaining Hi-Temp Reliability!
机译:GCI的提取能力得到证实可靠,标准高温封装增加了超过250倍的寿命(适用于应用> 185C),NI / AU或NI / PD / AU焊盘再现增加了1000多倍(适用于应用程序> 185C ),NI / AU或NI / PD / AU PAD再现允许传统组件,同时保持HI-TEMP可靠性!

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