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Theoretical Study of Ge Dangling Bonds in GeO_2 and Correlation with ESR Results at Ge/GeO_2 interfaces

机译:GEO_2 GE悬空键的理论研究和GE / GEO_2接口的ESR结果相关性

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The g-tensors of dangling bonds at defective Ge atoms in GeO_2 are computed using density functional theory. The isotropic g-values of these defects are found to increase with the number of Ge backbonds. By comparing these calculations with the isotropic g-value of a Ge-related defect at Ge/GeO_2 interfaces, recently observed by electron spin resonance and electrically detected magnetic resonance experiments, we tentatively identify this defect as a Ge_2O≡05 Ge~· center, i.e. a dangling bond on a Ge atom backbonded to two Ge atoms and one O atom, likely present near the Ge/GeO_2 interface. The interaction of this defect with molecular hydrogen is investigated using first-principles molecular dynamics simulations. Our simulations predict that the Ge dangling bond can be hardly passivated by H_2 molecules, in agreement with the electron spin resonance study.
机译:使用密度泛函理论计算在GEO_2中有缺陷的GE原子的悬空键的G-张力。发现这些缺陷的各向同性G值随着GE底击的数量而增加。通过将这些计算与GE / GEO_2接口的GE相关缺陷的各向同性G值进行比较,最近被电子自旋共振和电检测磁共振实验观察到,我们暂时将此缺陷识别为GE_2O≡05GE〜·中心,即在GE原子上悬空的粘合键在GE / GEO_2接口附近存在于两个GE原子和一个O原子。使用一原子分子动力学模拟研究了与分子氢的这种缺陷的相互作用。我们的模拟预测,与电子旋转共振研究一致,GE悬空键可能几乎不能通过H_2分子钝化。

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