首页> 外国专利> Contact structure in probe card, has projection made of electrically conducting material provided in contact board to connect contact pad that is in electrical communication with PCB, via contact trace in via hole

Contact structure in probe card, has projection made of electrically conducting material provided in contact board to connect contact pad that is in electrical communication with PCB, via contact trace in via hole

机译:探针卡中的接触结构,具有由导电材料制成的凸起,该凸起设置在接触板上,以通过通孔中的接触迹线连接与PCB电连通的接触垫

摘要

A projection (30) made up of electrically conductive material attached to a contact board (20), is in contact with a conductive pad (36) that is formed at back side of the contact board to contact a printed circuit board (62) through an electroconductive bump (56). The projection (30) contacts the conductive pad (36) through a trace provided in via hole (35) formed at contact board.
机译:由附接到接触板(20)的由导电材料制成的突起(30)与形成在接触板的背面的导电垫(36)接触,以通过印刷电路板(62)接触印刷电路板(62)。导电凸块(56)。突起(30)通过设置在形成在接触板上的通孔(35)中的迹线接触导电垫(36)。

著录项

  • 公开/公告号DE10015744A1

    专利类型

  • 公开/公告日2001-01-18

    原文格式PDF

  • 申请/专利权人 ADVANTEST CORP. TOKIO/TOKYO;

    申请/专利号DE2000115744

  • 发明设计人 JONES MARK R.;KHOURY THEODORE A.;

    申请日2000-03-29

  • 分类号H01R11/18;H01L49/02;G01R31/28;H01R43/00;B81B7/00;

  • 国家 DE

  • 入库时间 2022-08-22 01:09:53

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