首页> 外国专利> FILLING SUBSTRATE DEPRESSIONS WITH SiO2 BY HDP VAPOR PHASE DEPOSITION WITH PARTICIPATION OF H2O2 OR H2O AS REACTION GAS

FILLING SUBSTRATE DEPRESSIONS WITH SiO2 BY HDP VAPOR PHASE DEPOSITION WITH PARTICIPATION OF H2O2 OR H2O AS REACTION GAS

机译:通过HDP气相沉积和H2O2或H2O作为反应气的参与用SiO2填充基质减压

摘要

PURPOSE: A method is provided to fill even depressions with a high aspect ratio without leading to the formation of voids by filling substrate depressions with silicon oxide using HDP(High Density Plasma) CVD with participation of H2O2 or H2O as reaction gas. CONSTITUTION: A trench(25) is formed in a substrate(28). The trench(25), which has an aspect ratio of approximately, has already been partially filled from a bottom(26) with a SiO2 filling material(30). The SiO2 filling material(30) is deposited on a sidewalls(27) of the trench(25). The deposition of SiO2(30) has also taken place outside the trench(25). The process largely avoids any sputtering effects. On account of the fact that the sputtering effects are largely suppressed by means of the method, the redeposition of the SiO2 on the side walls is reduced in such a way that the depression can be filled in a manner free from pocket voids.
机译:用途:提供了一种方法,该方法通过使用HDP(高密度等离子体)CVD和H2O2或H2O作为反应气体参与,用氧化硅填充衬底凹陷,从而填充高纵横比均匀的凹陷而不会导致空隙的形成。构成:在基板(28)上形成沟槽(25)。具有大约长宽比的沟槽(25)已经从底部(26)部分地填充有SiO 2填充材料(30)。 SiO 2填充材料(30)沉积在沟槽(25)的侧壁(27)上。 SiO 2(30)的沉积也发生在沟槽(25)的外部。该过程很大程度上避免了任何溅射效应。由于通过该方法在很大程度上抑制了溅射效果,因此减少了SiO 2在侧壁上的再沉积,使得凹陷可以以没有空穴的方式被填充。

著录项

  • 公开/公告号KR20030038438A

    专利类型

  • 公开/公告日2003-05-16

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号KR20020068203

  • 发明设计人 KIRCHHOFF MARKUS;

    申请日2002-11-05

  • 分类号H01L21/763;

  • 国家 KR

  • 入库时间 2022-08-21 23:47:08

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