首页> 外国专利> Monolithically integrated self-aligned GaN-HEMTs and Schottky diodes and method of fabricating the same

Monolithically integrated self-aligned GaN-HEMTs and Schottky diodes and method of fabricating the same

机译:单片集成自对准GaN-HEMT和肖特基二极管及其制造方法

摘要

Monolithic integration of high-frequency GaN-HEMTs and GaN-Schottky diodes. The integrated HEMTs/Schottky diodes are realized using an epitaxial structure and a fabrication process which reduces fabrication cost. Since the disclosed process preferably uses self-aligned technology, both devices show extremely high-frequency performance by minimizing device parasitic resistances and capacitances. Furthermore, since the Schottky contact of diodes is formed by making a direct contact of an anode metal to the 2DEG channel the resulting structure minimizes an intrinsic junction capacitance due to the very thin contact area size. The low resistance of high-mobility 2DEG channel and a low contact resistance realized by a n+GaN ohmic regrowth layer reduce a series resistance of diodes as well as access resistance of the HEMT.
机译:高频GaN-HEMT和GaN-肖特基二极管的单片集成。集成的HEMT /肖特基二极管采用外延结构和降低了制造成本的制造工艺来实现。由于所公开的工艺最好使用自对准技术,因此两个器件都通过使器件的寄生电阻和电容最小化而表现出极高的高频性能。此外,由于二极管的肖特基接触是通过使阳极金属与2DEG通道直接接触而形成的,由于非常薄的接触面积,所得到的结构使固有结电容最小化。高迁移率2DEG通道的低电阻和n + GaN欧姆再生层实现的低接触电阻降低了二极管的串联电阻以及HEMT的访问电阻。

著录项

  • 公开/公告号US8946724B1

    专利类型

  • 公开/公告日2015-02-03

    原文格式PDF

  • 申请/专利权人 HRL LABORATORIES LLC;

    申请/专利号US201313907704

  • 发明设计人 KEISUKE SHINOHARA;DEAN C. REGAN;

    申请日2013-05-31

  • 分类号H01L29/15;H01L27/06;H01L29/872;

  • 国家 US

  • 入库时间 2022-08-21 15:17:11

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