首页> 外国专利> VERTICAL TYPE SCHOTTKY BARRIER DIODE USING GALLIUM NITRIDE SUBSTRATE AS DRIFT LAYER

VERTICAL TYPE SCHOTTKY BARRIER DIODE USING GALLIUM NITRIDE SUBSTRATE AS DRIFT LAYER

机译:垂直型肖特基势垒二极管,使用氮化镓基体作为漂移层

摘要

PROBLEM TO BE SOLVED: To provide a Schottky barrier diode including a GaN substrate, which has high voltage resistance and which is adapted for a large current and reduced in size.SOLUTION: A Schottky barrier diode using an n-GaN substrate as a drift layer comprises: the n-GaN substrate having a predetermined impurity density and polished into a mirror-like condition so that the n-GaN substrate has one face made one of N and Ga faces, and the other face made the other of N and Ga faces; an n-GaN layer formed on the one face; an ohmic electrode formed on the n-GaN layer; a Schottky electrode formed on the other face of the n-GaN substrate; and an insulative film or a p-GaN layer formed on the surface on the side of the Schottky electrode, which overlaps with the Schottky electrode.SELECTED DRAWING: Figure 4
机译:解决的问题:提供一种包括GaN衬底的肖特基势垒二极管,该GaN衬底具有高耐压性并且适用于大电流且尺寸减小。解决方案:使用n-GaN衬底作为漂移层的肖特基势垒二极管。包括:具有预定杂质密度并抛光成镜面状的n-GaN衬底,使得n-GaN衬底的一个面为N和Ga面之一,另一个面为N和Ga面中的另一个;在一个面上形成的n-GaN层;在n-GaN层上形成的欧姆电极;在n-GaN衬底的另一面上形成的肖特基电极。并在与肖特基电极重叠的肖特基电极侧面的表面上形成绝缘膜或p-GaN层。图4

著录项

  • 公开/公告号JP2016092083A

    专利类型

  • 公开/公告日2016-05-23

    原文格式PDF

  • 申请/专利权人 NAGOYA INSTITUTE OF TECHNOLOGY;

    申请/专利号JP20140222104

  • 发明设计人 EGAWA TAKASHI;

    申请日2014-10-31

  • 分类号H01L29/872;H01L29/47;

  • 国家 JP

  • 入库时间 2022-08-21 14:46:47

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