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LA-ICP-MS DEVICE USING QUANTITATIVE ANALYSIS METHOD AND LA-ICP-MS DEVICE

机译:使用定量分析方法的LA-ICP-MS装置和LA-ICP-MS装置

摘要

PROBLEM TO BE SOLVED: To provide a quantitative analysis method using a LA-ICP-MS device enabling a quantitative analysis to be performed without using a solid standard sample.;SOLUTION: A quantitative analysis method employs a LA-ICP-MS device having an ICP-MS unit 3 for performing a quantitative analysis by ionizing fine sample powder generated by a LA unit 2 or an ETV unit 1, respectively. The quantitative analysis method includes: a step of introducing the fine sample powder generated by performing a laser ablation on a solid sample 9 to be an analysis object into the ICP-MS unit 3 and measuring a first signal intensity of a detected element ion of a solid sample 9; and a step of introducing the fine sample powder generated by heating and vaporizing a standard liquid sample 49 including a known content of the element contained in the solid sample 9 into the ICP-MS unit 3 and measuring a second signal intensity of the detected element ion obtained from a standard solid sample 49; and a step of obtaining a content of the detected element in the solid sample 9 based on the first signal intensity and the second signal intensity.;SELECTED DRAWING: Figure 1;COPYRIGHT: (C)2018,JPO&INPIT
机译:解决的问题:提供一种使用LA-ICP-MS装置的定量分析方法,使得无需使用固体标准样品即可进行定量分析。解决方案:一种定量分析方法采用具有以下特征的LA-ICP-MS装置: ICP-MS单元3,用于通过电离由LA单元2或ETV单元1产生的样品细粉来进行定量分析。定量分析方法包括以下步骤:将通过对作为分析对象的固体样品9进行激光烧蚀而生成的精细样品粉末引入ICP-MS单元3中,并测量所检测到的元素离子的第一信号强度。固体样品9;将通过加热和汽化包含已知含量的固体样品9中所含元素的标准液体样品49而产生的细样品粉末引入ICP-MS单元3中,并测量检测到的元素离子的第二信号强度的步骤从标准固体样品49获得; ;以及根据第一信号强度和第二信号强度获得固体样品9中被检测元素的含量的步骤。选图:图1;版权:(C)2018,JPO&INPIT

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