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LA-ICP-MS DEVICE USING QUANTITATIVE ANALYSIS METHOD AND LA-ICP-MS DEVICE
LA-ICP-MS DEVICE USING QUANTITATIVE ANALYSIS METHOD AND LA-ICP-MS DEVICE
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机译:使用定量分析方法的LA-ICP-MS装置和LA-ICP-MS装置
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摘要
PROBLEM TO BE SOLVED: To provide a quantitative analysis method using a LA-ICP-MS device enabling a quantitative analysis to be performed without using a solid standard sample.;SOLUTION: A quantitative analysis method employs a LA-ICP-MS device having an ICP-MS unit 3 for performing a quantitative analysis by ionizing fine sample powder generated by a LA unit 2 or an ETV unit 1, respectively. The quantitative analysis method includes: a step of introducing the fine sample powder generated by performing a laser ablation on a solid sample 9 to be an analysis object into the ICP-MS unit 3 and measuring a first signal intensity of a detected element ion of a solid sample 9; and a step of introducing the fine sample powder generated by heating and vaporizing a standard liquid sample 49 including a known content of the element contained in the solid sample 9 into the ICP-MS unit 3 and measuring a second signal intensity of the detected element ion obtained from a standard solid sample 49; and a step of obtaining a content of the detected element in the solid sample 9 based on the first signal intensity and the second signal intensity.;SELECTED DRAWING: Figure 1;COPYRIGHT: (C)2018,JPO&INPIT
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