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Two-dimensional charge carrier mobility studies of regioregular P3HT

机译:区域规则P3HT的二维电荷载流子迁移率研究

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Charge carrier mobility of regioregular poly(3-hexylthiophene) (RR-P3HT) is studied within the temperature range 77 - 370 K using thin film field-effect transistors (FETs). The non-monotonic thickness dependence of the room temperature field-effect mobility (#mu#) has a maximum at approx 10 nm. The film thickness was varied both by changing the concentration of the solution of RR-P3HT in chloroform and by varying the spin coating speed. For films about 5-10 nm thick the maximum mobility is #mu# approx 10~(-3) cm~2V~(-1)s~(-1) and the maximum on-off ratio is > 10~5. At low T, #mu#(T) = #mu#_0 exp(-(T_0/T)~(0.33)). The results support Mott's variable-range hopping model for two-dimensional systems.
机译:使用薄膜场效应晶体管(FET)在77-370 K的温度范围内研究了规则型聚(3-己基噻吩)(RR-P3HT)的电荷载流子迁移率。室温场效应迁移率(#mu#)的非单调厚度依赖性最大,约为10 nm。通过改变RR-P3HT在氯仿中的溶液的浓度和通过改变旋涂速度来改变膜厚度。对于约5-10 nm厚的薄膜,最大迁移率约为#mu#,约为10〜(-3)cm〜2V〜(-1)s〜(-1),最大开关比> 10〜5。在低T下,#mu#(T)=#mu#_0 exp(-(T_0 / T)〜(0.33))。结果支持了Mott用于二维系统的可变范围跳变模型。

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