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Distance dependence of force and dissipation in non-contact atomic force microscopy on Cu(100) and Al(111)

机译:非接触原子力显微镜对Cu(100)和Al(111)的力和耗散的距离依赖性

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摘要

The dynamic characteristics of a tip oscillating in the nc-AFM mode in close vicinity to a Cu( 100)-surface are investigated by means of phase variation experiments in the constant amplitude mode. The change of the quality factor upon approaching the surface deduced from both frequency shift and excitation versus phase curves yield to consistent values. The optimum phase is found to be independent of distance. The dependence of the quality factor on distance is related to true' damping, because artefacts related to phase misadjustment can be excluded. The experimental results, as well as on-resonance measurements at different bias voltages on an Al(111) surface, are compared to Joule dissipation and to a model of dissipation in which long-range forces lead to viscoelastic deformations.
机译:通过在恒定振幅模式下的相变实验研究了在nc-AFM模式下靠近Cu(100)表面振荡的尖端的动态特性。由频移和激励相对于相位曲线得出的接近表面时品质因数的变化产生一致的值。发现最佳相位与距离无关。质量因数对距离的依赖性与真实阻尼有关,因为可以排除与相位失调有关的伪像。实验结果,以及在Al(111)表面上不同偏置电压下的导通共振测量结果,均与焦耳耗散以及长距离力导致粘弹性变形的耗散模型进行了比较。

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