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Kelvin probe force microscopy on surfaces of UHV eleaved ionic crystals

机译:开尔文探针力显微镜在超高压离子晶体的表面

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摘要

Force spectroscopy and Kelvin probe force microscopy (KPFM) measurements taken on (001) surfaces of UHV cleaved NaCl KC1 and MgO are presented for the first time. With the help of force spectroscopy we show first that the charging of (001) surfaces of alkali halide crystals, which generally occurs after UHV cleavage, vanishes after a couple of days due to their sufficiently high ionic conductivity at room temperature. KPFM images of these (001) surfaces show that the surface potential is not uniform but exhibits variations of up to 1 V at a nanometre length scale. Variations on terraces as well as a strong contrast at step edges can be observed, of which the latter is probably due to trapped charges. On MgO(001), we observe strong changes in the surface potential, especially at previously reported adstructures. These changes explain why imaging MgO(001) is difficult.
机译:首次展示了在特高压裂解的NaCl KCl和MgO的(001)表面上进行的力谱和开尔文探针力显微镜(KPFM)测量。借助力谱,我们首先显示出碱金属卤化物晶体的(001)表面带电(通常发生在UHV裂解之后)由于在室温下足够高的离子电导率而在几天后消失。这些(001)表面的KPFM图像显示,表面电势不均匀,但在纳米级的尺度上显示出高达1 V的变化。可以观察到梯田的变化以及台阶边缘的强烈反差,其中台阶的边缘可能是由于电荷的俘获。在MgO(001)上,我们观察到了表面电势的强烈变化,尤其是在先前报道的adstructures上。这些变化解释了为什么对MgO(001)成像困难。

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