...
首页> 外文期刊>Nanotechnology >Space charge limited currents and trap concentrations in GaAs nanowires
【24h】

Space charge limited currents and trap concentrations in GaAs nanowires

机译:GaAs纳米线中的空间电荷限制电流和陷阱浓度

获取原文
获取原文并翻译 | 示例
           

摘要

Electrical transport through individual solution-grown GaAs nanowires was measured as a function of temperature. The current-voltage (I V) curves are nonlinear and exhibit space charge limited currents. The I V curves become increasingly nonlinear with decreasing temperature and follow the scaling relationship J propor. to v~(l+1). This scaling indicates that the space charge limited currents are limited by trapped charge. The characteristic energies of the trap states were estimated from the I V data and found to vary from wire to wire, ranging from 0.024 to 0.11 eV below the band edge. In the low bias region of the I V curves, where the curves were ohmic, the activation energy (related to the Fermi energy) was determined and found to be shifted significantly towards the band edge, which indicates either the presence of a large concentration of impurities, such as Si, in the nanowires or charged surface states.
机译:测量通过各个溶液生长的GaAs纳米线的电迁移与温度的关系。电流-电压(IV)曲线是非线性的,并表现出空间电荷限制的电流。随着温度降低,IV曲线变得越来越非线性,并遵循比例关系Jpropor。到v〜(l + 1)。这种缩放比例表明,空间电荷限制电流受捕获电荷的限制。陷阱态的特征能量由I V数据估算得出,并且随导线而变化,在带边以下0.024至0.11 eV范围内。在IV曲线的低偏置区域(曲线为欧姆),确定了活化能(与费米能有关),发现其显着移向能带边缘,这​​表明存在大量杂质在纳米线或带电的表面状态下,例如Si。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号