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首页> 外文期刊>Nanotechnology >Selective-area MOVPE fabrication of GaAs hexagonal air-hole arrays on GaAs(111)B substrates using flow-rate modulation mode
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Selective-area MOVPE fabrication of GaAs hexagonal air-hole arrays on GaAs(111)B substrates using flow-rate modulation mode

机译:使用流速调制模式在GaAs(111)B衬底上进行GaAs六角形气孔阵列的选择性区域MOVPE制备

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摘要

GaAs hexagonal air-hole arrays fabricated by selective-area metal-organic vapour phase epitaxy (SA-MOVPE) on patterned GaAs(111)B substrates are promising for applications to hexagonal air-hole-type two-dimensional photonic crystal (2D-PhC) slabs, because the grown structures exhibit smooth fiat surfaces surrounded by crystal facets. In this paper, we describe SA-MOVPE carried out under various gas-flow sequences in order to reduce the growth temperature, and to obtain uniform air-hole arrays without lateral over-growth (LOG). We found that the growth rate in the pattern region and LOG were closely related to the effective As coverage and the desorption rate of the source materials. By optimizing SA-MOVPE, we obtained uniform hexagonal air-hole arrays with almost no LOG for arrays with 500-400 nm periodicity using alternate supply of the source materials (flow-rate modulation epitaxy mode). Finally, we successfully fabricated air-bridge-type hole arrays using selective etching of a sacrificial layer for vertical confinement of light in 2D-PhCs.
机译:通过选择性区域金属有机气相外延(SA-MOVPE)在图案化的GaAs(111)B衬底上制造的GaAs六角形气孔阵列有望用于六角形气孔型二维光子晶体(2D-PhC) )平板,因为生长的结构显示出光滑的平坦表面,并被晶体小面包围。在本文中,我们描述了在各种气流顺序下进行的SA-MOVPE,以降低生长温度,并获得均匀的气孔阵列,而没有横向过度生长(LOG)。我们发现图案区域和LOG的增长率与有效As覆盖率和原料的解吸速率密切相关。通过优化SA-MOVPE,我们获得了交替使用源材料(流速调制外延模式)的均匀六角形气孔阵列,对于周期为500-400 nm的阵列几乎没有LOG。最终,我们成功地使用牺牲层的选择性蚀刻成功地制造了空气桥型孔阵列,以在2D-PhC中垂直限制光。

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