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Nanodomain manipulation for ultrahigh density ferroelectric data storage

机译:纳米域操作用于超高密度铁电数据存储

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摘要

Nanosized inverted domain dots in ferroelectric materials have potential application in ultrahigh density rewritable data storage systems. Herein, a data storage system is presented based on scanning non-linear dielectric microscopy and a thin film of ferroelectric single-crystal lithium tantalite. Through domain engineering, we succeeded in forming our smallest artificial nanodomain single dot at 5.1 nm diameter and an artificial nanodomain dot array with a memory density of 10.1 Tbit inch~(-2) and a bit spacing of 8.0 nm, representing the highest memory density for rewritable data storage reported to date. Subnanosecond (500 ps) domain switching speed has also been achieved. Next, actual information storage with a low bit error and high memory density was performed. A bit error ratio of less than 1 x 10~(-4) was achieved at an areal density of 258 Gbit inch~(-2). Moreover, actual information storage is demonstrated at a density of 1 Tbit inch~(-2).
机译:铁电材料中的纳米级反向畴点在超高密度可重写数据存储系统中具有潜在的应用。在此,提出了一种基于扫描非线性介电显微镜和铁电单晶钽酸锂薄膜的数据存储系统。通过域工程,我们成功地形成了直径为5.1 nm的最小的人工纳米域单点和具有10.1 Tbit inch〜(-2)的存储密度和8.0 nm的位距的人工纳米域点阵列,代表了最高的存储密度报告的可重写数据存储。还可以实现亚纳秒(500 ps)的域切换速度。接下来,执行具有低位错误和高存储密度的实际信息存储。在258 Gbit inch〜(-2)的面密度下,实现了小于1 x 10〜(-4)的误码率。此外,以1 Tbit inch〜(-2)的密度证明了实际的信息存储。

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