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Nanoscale etching and indentation of a silicon (001) surface with carbon nanotube tips

机译:具有碳纳米管尖端的硅(001)表面的纳米级蚀刻和压痕

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摘要

The possibility of nanoscale etching andindentation of a Si(001) (2×1) surface by (8.0) and (10,10)carbon nanotube tips is demonstrated, for the time, by classicalmoleculardynamics simulations employing Tersoff's many-bodypotential for a mixed C/Si/Ge system. In the scenario with thenanotube tip barely touching the surface atomistic etching isobserved, whereas in the nanoindentation scenario, the nanotubetip penetrates the surface without much hindrance. The results areexplained in terms of the relative strength of surface withoutmuch hindrance. The results are explained in terms of the relativestrength of the C-C,C-Si, and Si-Si bonds.
机译:当时,通过经典分子动力学模拟,使用Tersoff多体电势对混合C进行了纳米分子蚀刻,并发现了(8.0)和(10,10)碳纳米管尖端对Si(001)(2×1)表面进行纳米刻蚀的可能性。 / Si / Ge系统。在纳米管尖端几乎不接触表面的情况下,观察到原子蚀刻,而在纳米压痕情况下,纳米管尖端无任何阻碍地穿透表面。根据没有太大阻碍的表面相对强度来解释结果。用C-C,C-Si和Si-Si键的相对强度解释了结果。

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