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Optical properties of heavily doped GaAs nanowires and electroluminescent nanowire structures

机译:重掺杂GaAs纳米线和电致发光纳米线结构的光学性质

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摘要

We present GaAs electroluminescent nanowire structures fabricated by metal organic vapor phase epitaxy. Electroluminescent structures were realized in both axial pn-junctions in single GaAs nanowires and free-standing nanowire arrays with a pn-junction formed between nanowires and substrate, respectively. The electroluminescence emission peak from single nanowire pn-junctions at 10 K was registered at an energy of around 1.32 eV and shifted to 1.4 eV with an increasing current. The line is attributed to the recombination in the compensated region present in the nanowire due to the memory effect of the vapor-liquid-solid growth mechanism. Arrayed nanowire electroluminescent structures with a pn-junction formed between nanowires and substrate demonstrated at 5 K a strong electroluminescence peak at 1.488 eV and two shoulder peaks at 1.455 and 1.519 eV. The main emission line was attributed to the recombination in the p-doped GaAs. The other two lines correspond to the tunneling-assisted photon emission and band-edge recombination in the abrupt junction, respectively. Electroluminescence spectra are compared with the micro-photoluminescence spectra taken along the single p-, n-and single nanowire pn-junctions to find the origin of the electroluminescence peaks, the distribution of doping species and the sharpness of the junctions.
机译:我们提出了通过金属有机气相外延制造的GaAs电致发光纳米线结构。在单个GaAs纳米线的轴向pn结和在纳米线与衬底之间分别形成pn结的独立式纳米线阵列中,都实现了电致发光结构。来自单个纳米线pn结的10 K处的电致发光发射峰在约1.32 eV的能量处记录,并随着电流的增加而移动到1.4 eV。该线归因于由于气液固增长机制的记忆效应而在纳米线中存在的补偿区域中的重组。在纳米线和衬底之间形成的具有pn结的阵列式纳米线电致发光结构在5 K处显示出1.488 eV处的强电致发光峰和1.455 e和1.519 eV处的两个肩峰。主发射线归因于p掺杂GaAs中的重组。另外两条线分别对应于突变结中的隧穿辅助光子发射和带边缘重组。将电致发光光谱与沿单个p,n和单个纳米线pn结获取的微光致发光光谱进行比较,以找到电致发光峰的起源,掺杂种类的分布和结的清晰度。

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