Effective electron microrefrigeration by superconductor-insulator-normal metal tunnel junctions with advanced geometry of electrodes and normal metal traps

摘要

We demonstrate effective electron cooling of the normal metal strip by superconductor-insulator-normal metal (SIN) tunnel junctions. The improvement was achieved by two methods: first, by using an advanced geometry of the superconducting electrodes for more effective removal of the quasiparticles; and second, by adding a normal metal trap just near the cooling junctions. With simple cross geometry and without normal metal traps, the decrease in electron temperature is 56 mK. With the advanced geometry of the superconducting electrodes, the decrease in electron temperature is 129 mK. With the addition of the normal metal traps, the decrease in electron temperature is 197 mK.