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Field gradient imaging of nanoparticle systems: analysis of geometry and surface coating effects

机译:纳米粒子系统的场梯度成像:几何和表面涂层效应分析

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In this work we compare the standard imaging of various types of nanoparticles deposited on surfaces by atomic force microscopy (AFM) with a complementary analysis of the same samples by either electrostatic force microscopy (EFM) or magnetic force microscopy (MFM). Experiments were carried out on gold nanoparticles ( decahedrons and stars) and two different iron oxide systems: goethite (alpha-FeOOH) and hematite (alpha-Fe2O3). Regardless of the particular geometry, the EFM signal appears to be stronger on edges or tips of pure gold nanoparticles. Both EFM and MFM experiments were also carried out on iron oxide particles. Apart from the structural analysis, we analyzed the influence of a shell layer deposited on the gold and iron oxide particles, the shell being amorphous SiO2. Although the silica layer was found to have an insulating effect around the particles, in all cases EFM/MFM measurements could still be performed by the proper choice of the scan lift height ( with an eventual slight increase of the sample bias, where applicable).
机译:在这项工作中,我们将通过原子力显微镜(AFM)对沉积在表面上的各种类型纳米颗粒的标准成像与通过静电力显微镜(EFM)或磁力显微镜(MFM)对相同样品进行的补充分析进行比较。在金纳米颗粒(十面体和恒星)和两种不同的氧化铁体系:针铁矿(α-FeO​​OH)和赤铁矿(α-Fe2O3)上进行了实验。无论特定的几何形状如何,EFM信号在纯金纳米颗粒的边缘或尖端似乎都更强。还对氧化铁颗粒进行了EFM和MFM实验。除了结构分析外,我们还分析了沉积在金和氧化铁颗粒上的壳层的影响,该壳为无定形SiO2。尽管发现二氧化硅层在颗粒周围具有绝缘作用,但在所有情况下,仍然可以通过适当选择扫描高度来进行EFM / MFM测量(如果适用,最终会稍微增加样品的偏斜)。

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