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The electrical conductivity of hydrogenated nanocrystalline silicon investigated at the nanoscale

机译:在纳米尺度上研究氢化纳米晶硅的电导率

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Hydrogenated nanocrystalline silicon (nc-Si:H) is a multiphase, heterogeneous material, composed of Si nanocrystals embedded in an amorphous matrix. It has been intensively studied in the last few years due to its great promise for photovoltaic and optoelectronics applications. The present paper aims to study the current transport mechanisms in nc-Si:H by mapping the local conductivity at the nanoscale. The role of B doping in nc-Si:H is also investigated. Conductivity maps are obtained by atomic force microscopy using a conductive tip. Differences and similarities between intrinsic and doped nc-Si:H conductivity maps were observed and these are also explained on the basis of recently published computational studies.
机译:氢化纳米晶硅(nc-Si:H)是一种多相异质材料,由嵌入非晶基质中的Si纳米晶组成。由于其在光伏和光电应用方面的巨大前景,近几年来已对其进行了深入研究。本文旨在通过绘制纳米尺度的局部电导率来研究nc-Si:H中的电流传输机制。还研究了B掺杂在nc-Si:H中的作用。通过原子力显微镜使用导电尖端获得导电率图。观察到本征和掺杂的nc-Si:H电导率图之间的差异和相似性,并在最近发表的计算研究的基础上对此进行了解释。

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