...
首页> 外文期刊>Nanotechnology >Spatial and size-resolved electrostatic-directed deposition of nanoparticles on a field-generating substrate: theoretical and experimental analysis
【24h】

Spatial and size-resolved electrostatic-directed deposition of nanoparticles on a field-generating substrate: theoretical and experimental analysis

机译:在产生电场的基底上纳米粒子的空间分辨和尺寸分辨静电定向沉积:理论和实验分析

获取原文
获取原文并翻译 | 示例
           

摘要

We build on our prior work on electrostatically directed nanoparticle assembly on a field-generating substrate (Tsai et al 2005 Nanotechnology 16 1856-62). In this paper we develop a data set for particle size-resolved deposition, from which a Brownian dynamics model for the process can be evaluated. We have developed a trajectory model applied to positioning metal nanoparticles from the gas phase onto electrostatic patterns generated by biasing p-n junction substrates. Brownian motion and fluid convection of nanoparticles, as well as the interactions between the charged nanoparticles and the patterned substrate, including electrostatic force, image force and van der Waals force, are accounted for in the simulation. Using both experiment and simulation we have investigated the effects of the particle size, electric field intensity, and the convective flow on coverage selectivity. Coverage selectivity is most sensitive to electric field, which is controlled by the applied reverse bias voltage across the p-n junction. A non-dimensional analysis of the competition between the electrostatic and diffusion force is found to provide a means to collapse a wide range of process operating conditions and is an effective indicator of process performance.
机译:我们基于先前在产生电场的基底上进行静电定向纳米粒子组装的工作(Tsai等人2005 Nanotechnology 16 1856-62)。在本文中,我们开发了一个用于粒度解析沉积的数据集,从中可以评估该过程的布朗动力学模型。我们已经开发了一种轨迹模型,该模型适用于将气相中的金属纳米颗粒定位到通过偏置p-n结衬底而产生的静电图案上。在模拟中考虑了纳米粒子的布朗运动和流体对流,以及带电纳米粒子和图案化基底之间的相互作用,包括静电力,图像力和范德华力。通过实验和模拟,我们研究了粒径,电场强度和对流对覆盖选择性的影响。覆盖选择性对电场最敏感,这由跨p-n结施加的反向偏置电压控制。发现对静电力和扩散力之间的竞争进行了无量纲分析,从而为破坏广泛的工艺操作条件提供了一种手段,并且是工艺性能的有效指标。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号