Evidence of surface charge effects in T-branch nanojunctions using microsecond-pulse testing

摘要

The understanding of the influence of surface charge effects on the electrical properties of nanostructures is a key aspect for the forthcoming generations of electronic devices. In this paper, by using an ultrafast electrical pulse characterization technique, we report on the room-temperature time response of a T-branch nanojunction which allows us to identify the signature of surface states. Different pulse widths from 500ns to 100νs were applied to the device. For a given pulse width, the stem voltage is measured and compared with the DC result. The output value in the stem is found to depend on the pulse width and to be related to the characteristic charging time of the interface states. As expected, the results show that the well-known nonlinear response of T-branch junctions is more pronounced for long pulses, beyond such a characteristic time.