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The photoluminescent lifetime of polyelectrolytes in thin films formed via layer by layer self-assembly

机译:逐层自组装形成的薄膜中聚电解质的光致发光寿命

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摘要

We present results on luminescence lifetime studies of thin multilayer films of polyelectrolyte molecules produced via layer by layer (LbL) electrostatic assembly. We found that, in contrast to common assumptions, LbL films show measurable photoluminescent lifetimes with an average value of 6 ns. Scanning fluorescence lifetime imaging microscopy studies combined with steady-state photoluminescence measurements imply that this lifetime may be due to aggregation of polyelectrolyte molecules during preparation of LbL films. This conclusion has been further confirmed by atomic force microscopy (AFM). AFM images clearly show the presence of 100-200 nm high aggregates on the surface of these films. This aggregation of polyelectrolyte molecules contributes significantly to the experimentally detected luminescence decays of any light-emitting samples attached to LbL film, especially in a single molecule detection regime. To demonstrate this effect we compare photoluminescence lifetime results for CdTe quantum dots deposited on the surface of LbL polyelectrolyte films.
机译:我们介绍了通过逐层(LbL)静电组装产生的聚电解质分子多层薄膜的发光寿命研究的结果。我们发现,与通常的假设相反,LbL薄膜显示出可测量的光致发光寿命,平均值为6 ns。扫描荧光寿命成像显微镜研究与稳态光致发光测量结果相结合,表明该寿命可能归因于LbL膜制备过程中聚电解质分子的聚集。原子力显微镜(AFM)进一步证实了这一结论。 AFM图像清楚地表明这些膜的表面上存在100-200 nm的高聚集体。聚电解质分子的这种聚集显着地促进了附着在LbL膜上的任何发光样品的实验检测发光衰减,特别是在单分子检测方案中。为了证明这种效果,我们比较了沉积在LbL聚电解质薄膜表面的CdTe量子点的光致发光寿命结果。

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