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Direct imaging of the visible emission bands from individual ZnO nanowires by near-field optical spectroscopy

机译:通过近场光学光谱法直接成像单个ZnO纳米线的可见发射带

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摘要

Room-temperature photoluminescence (PL) measurements have been performed on single-crystal ZnO nanowires grown on Si0_2/Si and quartz substrates by the vapor transport method using Au as a catalyst. Two emission bands are apparent, one in the UV spectral region around 380 nm (3.26 eV) associated with exciton recombination processes and a much broader structure in the visible range from 420 to 700 nm, which exhibits two distinct peak-like features around 520 and 590 nm (2.38 and 2.10 eV). Spectrally resolved scanning near-field optical microscopy (SNOM) of single ZnO nanowires have been performed for a direct imaging of the PL emission with spatial resolution below 100 nm. SNOM results provide evidence that the yellow emission band observed at 590 nm is a unique property of the ZnO nanowires, being most likely related to radiative recombination processes associated with Au impurities introduced during the catalytic growth.
机译:室温光致发光(PL)测量是通过使用Au作为催化剂的气相传输方法对生长在Si0_2 / Si和石英衬底上的单晶ZnO纳米线进行的。可见两个发射带,其中一个在380 nm(3.26 eV)的紫外光谱区域内与激子复合过程相关,在420至700 nm的可见光范围内具有更宽的结构,在520和520 nm附近表现出两个明显的峰状特征。 590 nm(2.38和2.10 eV)。单个ZnO纳米线的光谱分辨扫描近场光学显微镜(SNOM)已用于PL发射的直接成像,其空间分辨率低于100 nm。 SNOM结果提供了证据,表明在590 nm处观察到的黄色发射带是ZnO纳米线的独特属性,最有可能与在催化生长过程中引入的与Au杂质相关的辐射复合过程有关。

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