Structure of sputtered Co-Se thin films prepared for an application in catalysis

摘要

Co-Se thin films prepared by magnetron sputtering have shown significant activity for the oxygen reduction reaction. One sample, after sectioning by ultramicrotomy, was studied by high-resolution scanning transmission electron microscopy (HRSTEM) and scanning Auger microscopy (SAM), and X-ray diffraction (XRD) was used for characterizing further samples. These thin films were shown to have Co-Se nanocrystals embedded into Se-rich matrices. The TEM and XRD results were consistent with the nanocrystallites being non-stoichiometric with structures related to those of monoclinic Co1-xSe (x = 0.125-0.25). (c) 2006 Elsevier Inc. All rights reserved.