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首页> 外文期刊>IEEE Journal of Solid-State Circuits >Measurements and analysis of PLL jitter caused by digital switching noise
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Measurements and analysis of PLL jitter caused by digital switching noise

机译:数字开关噪声引起的PLL抖动的测量和分析

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摘要

When integrating analog and digital circuits onto a mixed-mode chip, power supply noise coupling is a major limitation on the performance of the analog circuitry. Several techniques exist for reducing the noise coupling, of which one of the cheapest is separating the power supply distribution networks for the analog and digital circuits. Noise coupling from a digital noise-generating circuit through the power supply/substrate into an analog phase-locked loop (PLL) is analyzed for three different power supply schemes. The main mechanisms for noise coupling are identified by comparing different PLLs and varying their bandwidths. It is found that the main cause of jitter strongly depends on the power supply configuration of the PLL. Measurements were done on mixed-mode designs in a standard 0.25-μm digital CMOS process with a low-resistivity substrate. The same circuits were also implemented with triple-well processing for comparisons.
机译:将模拟和数字电路集成到混合模式芯片上时,电源噪声耦合是模拟电路性能的主要限制因素。有几种技术可以降低噪声耦合,其中最便宜的技术之一是将模拟和数字电路的电源分配网络分开。针对三种不同的电源方案,分析了从数字噪声产生电路通过电源/基板到模拟锁相环(PLL)的噪声耦合。通过比较不同的PLL并改变其带宽,可以确定噪声耦合的主要机制。研究发现,抖动的主要原因很大程度上取决于PLL的电源配置。在采用低电阻率衬底的标准0.25μm数字CMOS工艺中对混合模式设计进行测量。相同的电路也实现了三孔处理以进行比较。

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