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Copper-cobalt heterobimetallic ceramic oxide thin film deposition: Synthesis, characterization and application of precursor

机译:铜钴异双金属陶瓷氧化物薄膜沉积:前驱体的合成,表征与应用

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摘要

Thin films of halide free Cu-Co mixed metal oxide have been prepared at 390 °C from the heterobimetallic complex Co4(THF)4(TFA)8(μ-OH)2Cu2(dmae)2 · 0.5C7H8 (1) [dmae = N,N-dimethylaminoethanol ((CH3)2NCH2CH2O~-), TFA = triflouroacetate (CF3COO~-), THF = tetrahydrofurane (C4H8O)] which was prepared by the reaction of [Cu(dmae)Cl]4 and Co(TFA)2 · 4H2O. The precursor was characterized for its melting point, elemental composition, FTIR and X-ray single crystal structure determination. Thin films grown on glass substrate by using AACVD out of complex 1 were characterized by XRD and SEM. TGA and AACVD experiments reveal it to be a suitable precursor for the deposition of halide free Cu-Co mixed-metal oxide thin films at relatively low temperatures.
机译:在390°C下由杂双金属配合物Co4(THF)4(TFA)8(μ-OH)2Cu2(dmae)2·0.5C7H8(1)制备了无卤化物的Cu-Co混合金属氧化物薄膜。 N,N-二甲基氨基乙醇((CH3)2NCH2CH2O〜-),TFA =三氟乙酸盐(CF3COO〜-),THF =四氢呋喃(C4H8O)],是通过[Cu(dmae)Cl] 4与Co(TFA)反应制备的2·4H2O。对前体的熔点,元素组成,FTIR和X射线单晶结构进行了表征。用XRD和SEM对复合物1中通过AACVD在玻璃基板上生长的薄膜进行了表征。 TGA和AACVD实验表明,它是在相对较低的温度下沉积不含卤化物的Cu-Co混合金属氧化物薄膜的合适前体。

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