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Fringe formation in an in-plane displacement measurement configuration with twofold increase in sensitivity: theory and experiment

机译:平面内位移测量配置中的条纹形成具有两倍的灵敏度:理论和实验

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摘要

A fringe-formation theory for a dual-beam illumination configuration that leads to a twofold increase in sensitivity for the measurement of in-plane displacement is described. Here we have taken into account all four beams simultaneously that are generated at the image plane owing to two-beam illumination and their cross-interference terms for fringe formation. We show that the sensitivity obtainable is the usual interferometric sensitivity when we take into account all four beams simultaneously and doubles only when the retroreflected beams are observed. A detailed theory and an experimental demonstration of the method are presented. (C) 1998 Optical Society of America. [References: 7]
机译:描述了用于双光束照明配置的条纹形成理论,该理论导致测量面内位移的灵敏度增加了两倍。在这里,我们考虑了由于两束照明而在像面上同时生成的所有四个光束以及它们的条纹形成的交叉干扰项。我们表明,当我们同时考虑所有四个光束时,可获得的灵敏度是通常的干涉灵敏度,并且仅当观察到回射光束时才翻倍。介绍了该方法的详细理论和实验证明。 (C)1998年美国眼镜学会。 [参考:7]

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