Estimating the root mean square of a wave front and its uncertainty

摘要

The root mean square (rms) of the surface departure or wave-front deformation is an important value to extract from an optical test. The rms may be a tolerance that an optical fabricator is trying to meet, or it may be a parameter used by an optical designer to evaluate optical performance. Because the calculation of a rms involves a squaring operation, the rms of the measured data map is higher on average than the rms of the true surface or wave-front deformation, even if the noise is zero on average. The bias becomes significant as the scale of the noise becomes comparable to the true surface or wave-front deformation, as can be the case in the testing of ultraprecision optics. We describe and demonstrate a simple data analysis method to arrive at an unbiased estimate of the rms and a means to determine the measurement uncertainty.