...
首页> 外文期刊>Applied optics >In situ measurement on ultraviolet dielectric components by a pulsed top-hat beam thermal lens
【24h】

In situ measurement on ultraviolet dielectric components by a pulsed top-hat beam thermal lens

机译:脉冲顶帽光束热透镜原位测量紫外线介电成分

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

A simple and sensitive mode-mismatched thermal lens (TL) technique with a pulsed top-hat beam excitation and a near-field detection scheme is developed to measure in situ the thermoelastic and the thermooptical responses of ultraviolet (UV) dielectric coatings as well as bulk materials under excimer laser (193- or 248-nm) irradiations. Owing to its high sensitivity, the TL technique can be used for measurements at fluences far below the laser-induced damage threshold (LIDT). We report on the measurement of both linear and nonlinear absorption of the UV dielectric coatings and bulk materials as well as the investigation of time-resolved predamage phenomena, such as laser conditioning of highly reflective dielectric coatings and irradiation-induced changes of a coating's various properties. The pulsed TL technique is also a convenient technique for accurate measurement of the LIDT of dielectric coatings and for distinguishing different damage mechanisms: thermal-stress-induced damage or melting-induced damage.
机译:开发了一种简单,灵敏的模式不匹配热透镜(TL)技术,该技术具有脉冲大礼帽光束激励和近场检测方案,可就地测量紫外线(UV)介电涂层的热弹性和热光响应,以及受激准分子激光(193-或248-nm)照射下的散装材料。由于其高灵敏度,TL技术可用于在远低于激光诱导损伤阈值(LIDT)的注量下进行测量。我们报告了紫外线介电涂层和块状材料的线性和非线性吸收的测量,以及时间分辨的预损坏现象的研究,例如高反射介电涂层的激光调理以及辐照引起的涂层各种性能的变化。脉冲TL技术还是一种方便的技术,可用于准确测量介电涂层的LIDT并区分不同的损坏机制:热应力引起的损坏或熔化引起的损坏。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号