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Spatial versus temporal phase shifting in electronic speckle-pattern interferometry: noise comparison in phase maps

机译:电子散斑图案干涉术中的空间与时间相移:相位图中的噪声比较

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摘要

Temporal and spatial phase shifting in electronic speckle-pattern interferometry are compared quantitatively with respect to the quality of the resultant deformation phase maps. On the basis of an analysis of the noise in sawtooth fringes a figure of merit is defined and measured for various in-plane and out-of-plane sensitive electronic speckle-pattern interferometry configurations. Varying quantities like the object-illuminating intensity, the beam ratio, the speckle size and shape, and the fringe density allows characteristic behaviors of both phase-shifting methods to be explored.
机译:相对于所得变形相位图的质量,定量比较了电子散斑图案干涉术中的时间和空间相移。基于对锯齿条纹中的噪声的分析,针对各种平面内和平面外敏感电子散斑图干涉配置,定义并测量了品质因数。诸如物体照明强度,光束比,散斑大小和形状以及条纹密度之类的变化量可以探索两种相移方法的特征行为。

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