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首页> 外文期刊>Applied optics >DETERMINATION OF ABSOLUTE EMISSION CROSS SECTIONS FOR ELECTRON-IMPACT-INDUCED LINE RADIATION IN THE VACUUM ULTRAVIOLET
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DETERMINATION OF ABSOLUTE EMISSION CROSS SECTIONS FOR ELECTRON-IMPACT-INDUCED LINE RADIATION IN THE VACUUM ULTRAVIOLET

机译:真空紫外线中电子撞击线辐射的绝对发射截面的测定

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摘要

A method and an experimental setup have been developed for measuring absolute photoemission cross sections for electron-impact-induced line radiation in the vacuum ultraviolet (VUV). Unparalleled low uncertainties for the cross sections were achieved mainly from the use of the Berlin electron storage ring as a primary standard source in the VUV for the determination of the responsivity of the spectrometer-detector system used and from the use of a spinning rotor gauge as a secondary standard. for the determination of the target gas density. As the first result we present a photoemission cross section for the Ar II 3s3p(6) S-2(1/2)-3s(2)3p(5) P-2(3/2) transition at 91.98 nm for 2-keV electron-impact energy of 1.167 x 10(-18) cm(2) with a relative uncertainty of 4.4% (root 3 sigma value). This low uncertainty demonstrates the suitability of the setup for further cross-section measurements. [References: 33]
机译:已经开发出一种方法和实验装置,用于测量真空紫外线(VUV)中电子撞击引起的线辐射的绝对光发射截面。截面的无与伦比的低不确定性主要是由于使用柏林电子存储环作为VUV中用于确定所使用的光谱仪-检测器系统的响应度的主要标准源以及通过使用旋转转子规来实现的。次要标准。用于确定目标气体密度。作为第一个结果,我们给出了Ar II 3s3p(6)S-2(1/2)-3s(2)3p(5)P-2(3/2)跃迁在91.98 nm处2-的光发射截面keV电子碰撞能量为1.167 x 10(-18)cm(2),相对不确定度为4.4%(根3 sigma值)。这种低不确定性表明该装置适用于进一步的横截面测量。 [参考:33]

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