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Extrasampling and thermal behavior of diode lasers used as a reference source in a Fourier transform IR spectrometer

机译:傅立叶变换红外光谱仪中用作参考源的二极管激光器的额外采样和热行为

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The diode laser is often used as a reference source in an interferometer because its interferogram zero crossings allow for precise intervals to be used for sampling the measured interferogram. The diode laser side modes, the features of which depend on the laser's temperature and power, may generate extra sampling points. The number of extra sampling points is analytically evaluated, and the synthetic spectra are compared with those obtained experimentally using the Planetary Fourier Spectrometer. The conclusion is that the theoretical resolution is guaranteed in practice only when no more than one extra sampling point is generated. This is the case when either the diode laser side mode amplitudes are less than one half of the main mode amplitude or the distance in wave numbers between the modes and the main mode times the maximum optical path difference is less than 1. Finally, one an appropriate diode laser has been chosen, the actual spectral resolution might be degraded by device-operating conditions. # 1997 Optical Society of America
机译:二极管激光器经常被用作干涉仪中的参考源,因为它的干涉图过零允许将精确的间隔用于对测量的干涉图进行采样。二极管激光器的侧面模式(其功能取决于激光器的温度和功率)可能会产生额外的采样点。通过分析评估额外采样点的数量,并将合成光谱与使用行星傅立叶光谱仪实验获得的光谱进行比较。结论是,只有在生成不超过一个额外的采样点的情况下,才能在实践中保证理论分辨率。当二极管激光器侧模式振幅小于主模式振幅的一半,或者模式与主模式之间的波数距离乘以最大光程差小于1时,就是这种情况。选择了适当的二极管激光器后,实际的光谱分辨率可能会因设备工作条件而降低。 #1997美国眼镜学会

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