Processing and characterization of silver films used to fabricate hollow glass waveguides

摘要

Hollow glass waveguides are an increasingly popular fiber for the delivery of high-power IR laser radiation. At CO_(2) laser wavelengths the measured and theoretical losses agree, but at the 3-μm Er:YAG laser wavelength the losses remain higher than expected. The reason for this is the surface roughness of the silver film used to form the first layer of the Ag/AgI thin-film structure. We found that the roughness of the silver film increases fivefold as silyering times increase from 5 to 80 min. This increased surface roughness produces a concomitant linear increase in the attenuation coefficient for the silver-only guides for wavelengths shorter than approximately 5 μm.