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首页> 外文期刊>Applied optics >Damage threshold prediction of hafnia-silica multilayer coatings by nondestructive evaluation of fluence-limiting defects
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Damage threshold prediction of hafnia-silica multilayer coatings by nondestructive evaluation of fluence-limiting defects

机译:通过注量限制缺陷的无损评估预测氧化ha-二氧化硅多层涂层的损伤阈值

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摘要

A variety of microscopic techniques were employed to characterize fluence-limiting defects in hafnia-ailica multilayer coatings manufactured for the National Ignition Facility, a fusion laser with a wavelength of 1.053 μm and a pulse width of 3 ns. Photothermal microscopy, with the surface thermal lens effect, was used to map the absorption and thermal characteristics of 3 mm×3 mm areas of the coatings. High-resolution subaperture scans, with a 1-μm step size and a 3-μm pump-beam diameter, were conducted on the defects to characterize their photothermal properties. Optical and atomic force microscopy were used to identify defects and characterize their topography. The defects were then irradiated by a damage testing laser (1.06 μm and 3 ns) in single-shot mode until damage occurred. The results were analyzed to determine the role of nodular and nonnodular defects in limiting the damage thresholds of the multilayer coatings. It was found that, although different types of defect were present in these coatings, the fluence-limiting ones had the highest photothermal signals (up to 126× over the host coating). The implication of this study is that coating process improvements for hafnia-silica multilayer coatings should have a broader focus than just elimination of source ejection, since high photothermal signals frequently occur at nodule-free regions. The study also demonstrates that, for optics subject to absorption-induced thermal damage, photothermal microscopy is an appropriate tool for nondestructive identification of fluence-limiting defects.
机译:在国家点火装置,波长为1.053μm,脉冲宽度为3 ns的聚变激光器生产的hafnia-ailica多层涂层中,采用了多种显微技术来表征通量限制缺陷。具有表面热透镜效应的光热显微镜用于绘制3mm×3mm区域的吸收和热特性图。对缺陷进行了高分辨率亚孔径扫描,步长为1μm,泵浦光束直径为3μm,以表征其光热特性。光学和原子力显微镜用于识别缺陷并表征其形貌。然后以单次模式用损伤测试激光(1.06μm和3 ns)照射缺陷,直到发生损伤。分析结果以确定结节和非结节缺陷在限制多层涂层的损伤阈值中的作用。已经发现,尽管这些涂层中存在不同类型的缺陷,但通量限制缺陷具有最高的光热信号(在主体涂层上高达126倍)。这项研究的意义在于,对于氧化f-二氧化硅多层涂层而言,改进涂层工艺的重点应不仅仅是消除源喷射,因为高光热信号经常出现在无结节区域。这项研究还表明,对于受到吸收引起的热损伤的光学器件,光热显微镜是一种适当的工具,可以无损地识别通量限制缺陷。

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