Dual in-plane electronic speckle pattern interferometry system with electro-optical switching and phase shifting

Bowe Brian; Martin Suzanne; Toal Vincent; Langhoff Andreas; Whelan Maurice

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Dual in-plane electronic speckle pattern interferometry system with electro-optical switching and phase shifting

机译：具有电光切换和相移的双面电子散斑图案干涉系统

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《Applied optics》 |1999年第4期|共1页
作者
Bowe Brian; Martin Suzanne; Toal Vincent; Langhoff Andreas; Whelan Maurice;
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正文语种 eng
中图分类光学;
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1. Dual in-plane electronic speckle pattern interferometry system with electro-optical switching and phase shifting [J] . Bowe Brian, Martin Suzanne, Toal Vincent, Applied optics . 1999,第4期

机译：具有电光切换和相移的双面电子散斑图案干涉系统
2. Spatial phase shifting for pure in-plane displacement and displacement-derivative measurements in electronic speckle pattern interferometry (ESPI) [J] . Sirohi RS, Burke J, Helmers H, Applied optics . 1997,第23期

机译：电子散斑干涉法（ESPI）中纯平面内位移和位移导数测量的空间相移
3. Use of specklegrams background terms for speckle photography combined with phase-shifting electronic speckle pattern interferometry [J] . Redouane Zemmamouche, Jean-François Vandenrijt, Aīcha Medjahed, Optical engineering . 2015,第8期

机译：散斑图背景术语在散斑摄影中结合相移电子散斑图干涉法的使用
4. Study of Nanometer-Level Precise Phase-Shift System Used in Electronic Speckle Shearography and Phase-Shift Pattern Interferometry [C] . Chao Jing, Zhongling Liu, Ge Zhou, International conference on optical instruments and technology;OIT 2011 . 2012

机译：电子散斑剪切和相移图案干涉术中纳米级精确相移系统的研究
5. Simultaneous phase shifted digital speckle pattern interferometry. [D] . Saif, Babak Nasser. 2004

机译：同时相移数字散斑图案干涉仪。
6. Remarks on Residual Stress Measurement by Hole-Drilling and Electronic Speckle Pattern Interferometry [O] . Claudia Barile, Caterina Casavola, Giovanni Pappalettera, -1

机译：关于通过钻孔和电子散斑图干涉法测量残余应力的评论
7. Phase unwrapping for dual-beam electronic speckle pattern interferometry: method [O] . Yoshida, S, Suprapedi, Dr., Widiastuti, R., 1997

机译：用于双光束电子散斑图案干涉测量的相位展开：方法
8. Electronic Speckle Pattern Interferometry System for the Study of Mistuned Bladed Disks [R] . Pierre, C. 2000

机译：用于阻尼叶片研究的电子散斑干涉测量系统

Dual in-plane electronic speckle pattern interferometry system with electro-optical switching and phase shifting

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