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Common-path optical heterodyne profilometer: a configuration

机译:共路径光学外差轮廓仪:配置

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摘要

A novel configuration that combines a Linearly polarized He-Ne laser and a birefringent lens to produce a common-path polarized optical heterodyne profilometer with respect to the heterodyned P and S waves has been set up. In this profilometer a linear polarized frequency-stabilized He-Ne laser was used with an acousto-optical modulator to replace the Zeeman laser as the light source that had two polarization eigenstates in different temporal frequencies. The proposed interferometer shows a more symmetric and ideal common-path structure than the conventional optical heterodyne profilometers with the Zeeman laser. The phase error aroused by the elliptical polarization and the nonorthogonality of the two eigenpolarization modes of the Zeeman laser can be reduced. The system's resolution in the vertical direction reaches 2 Angstrom, and in a 27-mu m scanning range the repeatability of the surface profile measurements is shown to be 5 Angstrom. (C) 1998 Optical Society of America. [References: 13]
机译:已经建立了一种新颖的结构,该结构结合了线性偏振He-Ne激光器和双折射透镜,以产生关于杂散P和S波的共径偏振光学外差轮廓仪。在该轮廓仪中,使用线性偏振频率稳定的He-Ne激光器和声光调制器来代替Zeeman激光器作为光源,该光源在不同的时间频率具有两个偏振本征态。与使用塞曼激光器的传统光学外差轮廓仪相比,拟议的干涉仪显示出更加对称和理想的共通路径结构。可以减小由塞曼激光器的两种偏振模式的椭圆偏振和非正交引起的相位误差。该系统在垂直方向上的分辨率达到2埃,在27微米的扫描范围内,表面轮廓测量的可重复性显示为5埃。 (C)1998年美国眼镜学会。 [参考:13]

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