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首页> 外文期刊>Applied optics >Photometric methods for determining the optical constants and the thicknesses of thin absorbing films: selection of a combination of photometric quantities on the basis of error analysis
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Photometric methods for determining the optical constants and the thicknesses of thin absorbing films: selection of a combination of photometric quantities on the basis of error analysis

机译:确定吸收薄膜的光学常数和厚度的光度法:在误差分析的基础上选择光度数量的组合

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We select the best combinations of spectrophotometric quantities for the most accurate determination of the optical constants, n (refractive index), k (absorption coefficient), and the thicknesses of thin absorbing films. The basic comparative criteria used are the maximum absolute errors in the determination of n, k, and d that result from experimental errors in photometric measurements and in the optical constants of the substrates. We studied all possible combinations of photometric quantities T, T_(s)~(θ), T_(p)~(θ), R, R_(s)~(θ), R_(p)~(θ), R_(m), R_(ms)~(θ), and R_(mp)~(θ) at 0°<θ≤70°, where T denotes transmission; R, reflection; the subscripts s and p, s- and p-polarized light; m, reflection from a thin film coated upon an opaque substrate; and superscript θ, the angle of incidence of light. The absence of the subscripts s and p implies nonpolarized light; that of the subscript m, a nonabsorbing substrate; and that of superscript θ, normally incident light. The error analysis that is made admits the following conclusions: (1) The best double combinations are (TR), (TR_(m)), (TR_(p)~(70)), and (TR_(mp)~(70)); (2) the best triple combinations are (TRR_(m)), (TRR_(p)~(70)), (TRR_(mp)~(70)), (TR_(m)R_(p)~(70)), and (TR_(m)R_(mp)~(70)); (3) the methods indicated above, suitably combined, are quite sufficient to provide the maximum accuracy and reliability of n, k, and d for all practical situations; (4) TRR methods based on measurements with obliquely polarized light are more suitable for thin films with n<1, such as some metal films; (5) the regions of n, k, and d/λ with the highest and the lowest accuracies do not overlap in either the TR or the TRR methods. Hence more combinations, preferably all, should be applied for the most accurate determination of n, k (and d), and the errors should be evaluated as a criterion for the best combination.
机译:我们选择分光光度法量的最佳组合,以最准确地确定光学常数,n(折射率),k(吸收系数)和吸收薄膜的厚度。使用的基本比较标准是确定n,k和d时的最大绝对误差,这是由光度测量中的实验误差和基板的光学常数导致的。我们研究了测光量T,T_(s)〜(θ),T_(p)〜(θ),R,R_(s)〜(θ),R_(p)〜(θ),R_( m),R_(ms)〜(θ)和R_(mp)〜(θ)在0°<θ≤70°,其中T表示透射率; R,反射;下标s和p,s和p偏振光; m,从不透明基材上涂覆的薄膜的反射;上标θ是光的入射角。下标s和p的缺失表示非偏振光。下标m的值,非吸收性底物;上标θ是垂直入射光。通过进行错误分析,可以得出以下结论:(1)最佳双重组合是(TR),(TR_(m)),(TR_(p)〜(70))和(TR_(mp)〜(70) )); (2)最好的三重组合是(TRR_(m)),(TRR_(p)〜(70)),(TRR_(mp)〜(70)),(TR_(m)R_(p)〜(70) )和(TR_(m)R_(mp)〜(70)); (3)适当组合上述方法足以在所有实际情况下提供n,k和d的最大精度和可靠性; (4)基于斜偏振光测量的TRR方法更适合n <1的薄膜,例如某些金属膜; (5)在TR方法或TRR方法中,具有最高和最低精度的n,k和d /λ区域不重叠。因此,应将更多的组合(最好是所有组合)用于n,k(和d)的最准确确定,并且应将误差作为最佳组合的标准进行评估。

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