Experimental comparison of a Shack-Hartmann sensor and a phase-shifting interferometer for large-optics metrology applications

摘要

We performed a direct side-by-side comparison of a Shack-Hartmann wave-front sensor and a phase-shifting interferometer for the purpose of characterizing large optics. An expansion telescope of our own design allowed us to measure the surface figure of a 400-mm-square mirror with both instruments simultaneously. The Shack-Hartmann sensor produced data that closely matched the interferometer data over spatial scales appropriate for the lenslet spacing, and much of the <20-nm rms systematic difference between the two measurements was due to diffraction artifacts that were present in the interferometer data but not in the Shack-Hartmann sensor data. The results suggest that Shack-Hartmann sensors could replace phase-shifting interferometers for many applications, with particular advantages for large-optic metrology.