...
首页> 外文期刊>Applied optics >Continuous-wave Z-scan measurement of photorefractive SBN:60
【24h】

Continuous-wave Z-scan measurement of photorefractive SBN:60

机译:光折变SB​​N:60的连续波Z扫描测量

获取原文
获取原文并翻译 | 示例
           

摘要

A cw-probe Z-scan technique was employed to measure the photoinduced index change in a photorefractive SBN:60 crystal. For this experiment a three-detector data-acquisition system was used to account for temporal changes in the laser. The effects of various beam parameters such as intensity, polarization, and wavelength were studied. A theoretical simulation of the Z scan based on a band-transport model of photorefractive-index variation was also developed. This model provides reasonable agreement with the experimental results.
机译:连续波探针Z扫描技术用于测量光折变SB​​N:60晶体中的光诱导折射率变化。对于该实验,使用三探测器数据采集系统来说明激光器的时间变化。研究了各种光束参数(例如强度,偏振和波长)的影响。还建立了基于光折射率变化的带传输模型的Z扫描的理论模拟。该模型与实验结果合理吻合。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号