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首页> 外文期刊>Applied optics >FRINGE VISIBILITY, IRRADIANCE, AND ACCURACY IN COMMON PATH INTERFEROMETERS FOR VISUALIZATION OF PHASE DISTURBANCES
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FRINGE VISIBILITY, IRRADIANCE, AND ACCURACY IN COMMON PATH INTERFEROMETERS FOR VISUALIZATION OF PHASE DISTURBANCES

机译:相位干扰可视化的公共路径干涉仪中的条纹可见度,辐照度和准确性

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Common-path interferometers have been used to perform phase visualization for over 40 years. A number of techniques have been proposed, including dark central ground, phase contrast (pi/2 and pi), and field-absorption interferometers. The merits of the interferometers have been judged ad hoc by either tests with a small number of phase objects or by computer simulation. Three standardized criteria, which consolidate the work of others, are proposed to evaluate common-path interferometers: fringe visibility, fringe irradiance, and fringe accuracy. The interferometers can be described as one generic class of Fourier-plane filters and can be analyzed for all input conditions. Closed-form expressions are obtained for visibility acid irradiance under the forced condition that little inaccuracy is tolerated. This analysis finds that the pi-phase-contrast interferometer is a good choice if the optical phase disturbance is at least 2 pi; for Smaller disturbances, the pi/2 filter selected by Zernike is near optimum. It is shown mathematically that the resulting fringe visibility is highly object dependent, and good results are not ensured. By allowing the optical beam to be 50% larger than the phase object, the interferometer performs well under all conditions. With this approach and a combination pi-phase/field-absorption filter, interference fringe visibility is greater than 0.8 for all phase objects. (C) 1995 Optical Society of America [References: 12]
机译:共路径干涉仪已用于执行相位可视化40多年。已经提出了许多技术,包括黑暗的中心地面,相位衬度(pi / 2和pi)以及场吸收干涉仪。干涉仪的优点是通过对少量相位对象进行测试或通过计算机仿真来临时判断的。提出了三个标准,这些标准可以巩固其他工作,以评估共路径干涉仪:条纹可见度,条纹辐照度和条纹精度。干涉仪可以描述为一类傅立叶平面滤波器,并且可以针对所有输入条件进行分析。在几乎不容许误差的强制条件下,获得可见性酸辐照度的封闭式表达式。该分析发现,如果光学相位干扰至少为2 pi,则pi相位对比干涉仪是一个不错的选择。对于较小的干扰,Zernike选择的pi / 2滤波器接近最佳。从数学上表明,所得的条纹可见度高度依赖于对象,并且不能确保良好的结果。通过使光束比相位物体大50%,干涉仪在所有条件下的性能都很好。通过这种方法以及π相/场吸收滤波器的组合,对于所有相位对象,干涉条纹的可见性均大于0.8。 (C)1995年美国眼镜学会[参考文献:12]

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