Findings on the Electron-Attachment-Induced Abasic Site in a DNA Double Helix

摘要

A detailed knowledge of DNA damage induced by low-energy electrons (LEE) are of crucial importance both for the advancement of theoretical models of cellular radiolysis and for the development of new methods of radiotherapy. Studies on various DNA fragments have demonstrated that near 0 eV energy, electron attachment may induce strand breaks in DNA. Strand-breaking mechanisms have been proposed to elucidate the nature of DNA damage by LEE.