Reversible Superconductor-Insulator Transition in (Li, Fe)OHFeSe Flakes Visualized by Gate-Tunable Scanning Tunneling Spectroscopy

摘要

Electric field control of charge carrier density provides a key in situ technology to continuously tune the ground states and map out the phase diagram of correlated electron systems in one device. This technique is highly expected to be combined with the modern state-of-the art spectroscopic probes, such as angle-resolved photoemission spectroscopy and scanning tunneling microscopy/spectroscopy (STM/S), to efficiently address these states and the underlying physics. However, it is extremely difficult and not successful so far, mainly because the fabrication process of such devices makes them prohibitive for surface probes. Here, by using a solid Li-ion conductor (SIC) as gate dielectric, we have successfully developed gate-tunable STM/S and visualized the superconductor- insulator transition (SIT) in a thin flake of single crystal (Li, Fe)OHFeSe at the nanoscale. The gate-controlled Li-ion injection first enhances the superconductivity and then drives the flake into an inhomogeneous insulating state, where superconductivity is totally suppressed. This process can be reversed by applying an opposite gate voltage. Importantly, the atomically resolved images allow us to identify the critical role that the injected Li ions play in the tuning process. Our results not only provide clear evidence of the microscopic mechanism of the tunable superconductivity and SIT in the SIC-based (Li, Fe)OHFeSe devices, but also establish SIC-gating STM as a powerful tool for investigating the complicated phase diagram of correlated electron system spectroscopically in a single sample with the field-effect approach.