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Suppressed Out-of-Plane Polarizability of Free Excitons in Monolayer WSe2

机译:在单层WSE2中抑制自由激子的平面外极化性

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摘要

Monolayer semiconductors are atomically thin quantum wells with strong confinement of electrons in a two-dimensional (2D) plane. Here, we experimentally study the out-of-plane polarizability of excitons in hBN-encapsulated monolayer WSe2 in strong electric fields of up to 1.6 V/nm (16 MV/cm). We monitor free exciton photoluminescence peaks with increasing electric fields at a constant carrier density, carefully compensating for unintentional photodoping in our double-gated device at 4 K. We show that the Stark shift is smaller than 0.4 meV despite the large electric fields applied, yielding an upper limit of polarizability alpha(z) to be similar to 10(-11) Dm/V. Such a small polarizability, which is nearly two orders of magnitude smaller than the previously reported value for MoS2, indicates strong atomic confinement of electrons in this 2D system and highlights the unusual robustness of free excitons against surface potential fluctuations.
机译:单层半导体是原子薄的量子阱,其在二维(2D)平面中具有强大限制电子。 在这里,我们通过在高达1.6V / nm(16mV / cm)的强电场中,通过实验研究HBN封装的单层WSE2中激子的外平端极化性。 我们以恒定的载流子密度越来越多的电场监测自由的激子光致发光峰,仔细补偿我们在我们的双门控设备中的无意的光电探测到4 k。我们表明仍然存在大电场,屈服于0.4 mev。屈服 极化性α(z)的上限与10(-11)dm / v相似。 这种小的极化性,其比先前报道的MOS2值小几乎两个数量级,表明了该2D系统中电子的强原子禁闭,并突出了自由激子对表面电位波动的不寻常的鲁棒性。

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