Effect of solvents on structural anisotropy of polyaniline thin films

摘要

X-ray surface diffraction experiments performed on polyaniline/camphorsulfonic acid (PANI/CSA) thin films reveal high anisotropy of the five main crystalline peaks. This anisotropy is different for samples cast from m-cresol and cast from trifluoroacetic acid (TFA). Taking advantage of a recently published crystalline unit cell model, intensity distribution maps are calculated for these two types of samples. The anisotropy is in agreement with experiment, further validating the PANI/CSA model and showing that solvent molecules are not present in the unit cell.