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A charge-orbital balance picture of doping in colloidal quantum dot solids

机译:胶体量子点固体中掺杂的电荷轨道平衡图

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We present a framework-validated using both modeling and experiment-to predict doping in CQD films. In the ionic semiconductors widely deployed in CQD films, the framework reduces to a simple accounting of the contributions of the oxidation state of each constituent, including both inorganic species and organic ligands. We use density functional theory simulations to confirm that the type of doping can be reliably predicted based on the overall stoichiometry of the CQDs, largely independent of microscopic geometrical bonding configurations. Studies employing field-effect transistors constructed from CQDs that have undergone various chemical treatments, coupled with Rutherford backscattering and X-ray photoelectron spectroscopy to provide compositional analysis, allow us to test and confirm the proposed model in an experimental framework. We investigate both p- and n-type electronic doping spanning a wide range of carrier concentrations from 10 16 cm ~(-3) to over 10 ~(18) cm ~(-3), and demonstrate reversible switching between p- and n-type doping by changing the CQD stoichiometry. We show that the summation of the contributions from all cations and anions within the film can be used to predict accurately the majority carrier type. The findings enable predictable control over majority carrier concentration via tuning of the overall stoichiometry.
机译:我们提出了一种通过建模和实验验证的框架,以预测CQD薄膜中的掺杂。在CQD薄膜中广泛使用的离子半导体中,该框架简化为对每种成分(包括无机物和有机配体)的氧化态的贡献的简单说明。我们使用密度泛函理论模拟来确认可以基于CQD的总体化学计量可靠地预测掺杂类型,而在很大程度上与微观几何键合结构无关。使用由经过各种化学处理的CQD构造的场效应晶体管的研究,再加上卢瑟福反向散射和X射线光电子能谱,以提供成分分析,使我们能够在实验框架中测试和确认所提出的模型。我们研究了从10 16 cm〜(-3)到超过10〜(18)cm〜(-3)的多种载流子浓度的p型和n型电子掺杂,并证明了p型和n型之间可逆的转换通过改变CQD的化学计量进行掺杂。我们表明,薄膜中所有阳离子和阴离子的贡献总和可用于准确预测多数载流子类型。这些发现可以通过调整总体化学计量来控制大多数载流子浓度。

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