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Growth from below: Graphene bilayers on Ir(111)

机译:从下面生长:Ir(111)上的石墨烯双层

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We elucidate how graphene bilayers form on Ir(111). Low-energy electron diffraction (LEED) reveals that the two graphene layers are not always rotationally aligned. Monitoring this misalignment during growth shows that second-layer islands nucleate between the existing layer and the substrate. This mechanism occurs both when C segregates from the Ir and when elemental C is deposited from above. Low-energy electron microscopy (LEEM) and angle-resolved photoemission spectroscopy (ARPES) show that second-layer nucleation occurs preferentially under the first-layer rotational variants that are more weakly bound to the substrate. New-layer nucleation tends to occur inhomogeneously at substrate defects. Thus new-layer nucleation should be rapid on substrates that weakly bind graphene, making growth unstable toward mound formation initiated at substrate defects. In contrast, stronger binding permits layer-by-layer growth, as for Ru(0001). ARPES shows that bilayer graphene has two slightly p-doped π-bands. The work function of bilayer graphene is dominated by the orientation of the bottom layer.
机译:我们阐明了如何在Ir(111)上形成石墨烯双层。低能电子衍射(LEED)表明,两个石墨烯层并不总是旋转对齐的。在生长过程中监测这种未对准情况表明,第二层岛在现有层和基底之间成核。当C从Ir中分离时,以及元素C从上方沉积时,都会发生这种机理。低能电子显微镜(LEEM)和角分辨光电子能谱(ARPES)表明,第二层成核作用优先发生在与基材结合较弱的第一层旋转变体下。新层的成核趋向于在基底缺陷处不均匀地发生。因此,在薄弱结合石墨烯的基底上,新层成核应迅速进行,从而使生长对基底缺陷引发的土堆形成不稳定。相反,如Ru(0001),更强的结合力允许逐层生长。 ARPES显示双层石墨烯具有两个轻度p掺杂的π带。双层石墨烯的功函数受底层取向的支配。

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