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首页> 外文期刊>ACS nano >Electrochemical atomic-force microscopy using a tip-attached redox mediator. Proof-of-concept and perspectives for functional probing of nanosystems
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Electrochemical atomic-force microscopy using a tip-attached redox mediator. Proof-of-concept and perspectives for functional probing of nanosystems

机译:电化学原子力显微镜使用尖端连接的氧化还原介体。纳米系统功能探测的概念验证和前景

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This paper presents the first steps toward the development of a new type of high-resolution AFM-SECM microscopy which relies on the use of tip-attached redox-labeled polymer chains as mediators to probe the local electrochemical reactivity of a planar substrate at the nanoscale. Submicrometer-sized combined gold AFM-SECM probes were functionalized by linear, nanometer-sized, flexible, PEG_(3400) chains bearing a ferrocene (Fc) redox label at their free end. Analysis of the force and current approach curves recorded when such Fc-PEGylated probes (tips) were approached to a bare gold substrate allowed the presence of the Fc-PEG chains at the very tip end of the combined probes to be specifically demonstrated. It also allowed the chain coverage, configuration, and dynamics to be determined. When the Fc-PEGylated probe is positioned some ~5 nm above the substrate, only a few hundred chains are actually electrochemically contacting the surface, thus reducing the size of the tip-substrate interaction area to 20-40 nm. Most importantly, we have shown that the tip-borne PEG chains are flexible enough to allow their Fc heads to efficiently "sense" locally the electrochemical reactivity of the substrate, thus validating the working principle of the new AFM-SECM microscopy we propose. This innovative microscopy, we label Tarm (for tip-attached redox mediator)/AFM-SECM, should be particularly suitable for probing the activity of slowly functioning nanometer-sized active sites on surfaces, such as individual enzyme molecules, because it is, by design, free of the diffusional constraints which hamper the characterization of such nanosystems by classical SECM.
机译:本文介绍了开发新型高分辨率AFM-SECM显微镜的第一步,该显微镜依靠使用末端连接的氧化还原标记的聚合物链作为介体,在纳米级上探测平面基材的局部电化学反应性。亚微米大小的组合金AFM-SECM探针通过在其自由端带有二茂铁(Fc)氧化还原标记的线性,纳米大小,柔性PEG_(3400)链进行功能化。当将此类Fc-PEG化探针(尖端)接近裸金底物时记录的力和电流接近曲线的分析,可以明确证明在组合探针的最末端存在Fc-PEG链。它还允许确定链的覆盖范围,配置和动态。当Fc-PEG化探针位于底物上方约5 nm处时,实际上只有几百条链以电化学方式与表面接触,因此将末端-底物相互作用区域的大小减小到20-40 nm。最重要的是,我们已经证明,端部携带的PEG链具有足够的柔韧性,可以使其Fc头有效地“感知”局部的底物电化学反应,从而验证了我们提出的新型AFM-SECM显微镜的工作原理。这种创新的显微镜,我们标记为Tarm(用于末端连接的氧化还原介体)/ AFM-SECM,应该特别适用于探测表面上功能缓慢的纳米级活性位点(例如单个酶分子)的活性,因为它是通过设计不受扩散约束的影响,而扩散约束妨碍了经典SECM对此类纳米系统的表征。

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